Hartmann, Hans-Dieter: шукати на сайті Z-Library

Найбільша колекція наукових статей у сіті. 70,000,000+ безкоштовних статей.

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Статті (97)
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SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Rapid integrated circuit delayering without grass

Vanderlinde, William E., Von Benken, Christopher J., Crockett, Addison R., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 672 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Fast failure analysis and yield enhancement: an integrated approach

Lee, Fourmun, Doan, Nam, Liu, Lisa H., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 1.14 MB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Arc-induced gate oxide breakdown in plasma etching process

Song, Jungwoo, Lee, Heegee, Lee, Jung Hoon, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 349 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Shorter failure analysis using a new application of IDDQ for defect localization in ICs

Desplats, Romain, Fougnie, Bertrand, Perdu, Philippe, Benbrik, Jamel, Marc, Francois, Danto, Yves, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 1.68 MB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Automated collection of yield and performance analysis data during UltraSPARC-I microprocessor production test

Koeppen, Matt, Moore, John, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 848 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - UltraSPARC-I microprocessor yield and performance analysis

Wrobbel, Derek C., Walker, Kevin L., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 639 KB

english, 1996

N-(4-Hydroxyphenyl)-N-(1,1,1-trifluor-2-propyl)-4-hydroxybenzamid: Synthese und pharmakologische Bewertung eines neues Antiestrogens

Rolf W. Hartmann, Hans-Dieter Vom Orde, Alexander Heindl, Helmut Schönenberger

Журнал:

Archiv der Pharmazie

Рік:

1988

Мова:

german

Файл:

PDF, 459 KB

german, 1988

Antiestrogene N-(4-Hydroxyphenyl)-N-(1,1,1-trifluor-2-propyl)-4-hydroxybenzamide: Beeinflussung der Wirkung durch hydrophobe Reste in ortho-Position des Benzamidfragments

Rolf W. Hartmann, Hans-Dieter Vom Orde, Helmut Schönenberger

Журнал:

Archiv der Pharmazie

Рік:

1990

Мова:

german

Файл:

PDF, 512 KB

german, 1990

An Indole-Binding Site is a Major Determinant of the Ligand Specificity of the GABA Type A Receptor-Associated Protein GABARAP

Yvonne Thielmann, Jeannine Mohrlüder, Bernd W. Koenig, Thomas Stangler, Rudolf Hartmann, Karin Becker, Hans-Dieter Höltje, Dieter Willbold

Журнал:

ChemBioChem

Рік:

2008

Мова:

english

Файл:

PDF, 869 KB

english, 2008

Cover Picture: An Indole-Binding Site is a Major Determinant of the Ligand Specificity of the GABA Type A Receptor-Associated Protein GABARAP (ChemBioChem 11/2008)

Yvonne Thielmann, Jeannine Mohrlüder, Bernd W. Koenig, Thomas Stangler, Rudolf Hartmann, Karin Becker, Hans-Dieter Höltje, Dieter Willbold

Журнал:

ChemBioChem

Рік:

2008

Мова:

english

Файл:

PDF, 644 KB

english, 2008

Regulation of NK cell trafficking by CD81

Benjamin Krämer, Daniela Schulte, Christian Körner, Claudia Zwank, Agathe Hartmann, Monika Michalk, Jennifer Söhne, Bettina Langhans, Hans-Dieter Nischalke, Martin Coenen, Christoph Möhl, Annabelle Vo

Журнал:

European Journal of Immunology

Рік:

2009

Мова:

english

Файл:

PDF, 546 KB

english, 2009

42 V — an indication for changing requirements on the vehicle electrical system

Karsten Ehlers, Hans-Dieter Hartmann, Eberhard Meissner

Журнал:

Journal of Power Sources

Рік:

2001

Мова:

english

Файл:

PDF, 661 KB

english, 2001

Zum Absorptions-, Fluoreszenz- und Isomerisierungsverhalten styrylsubstitutierter 1,3-Diketo-borate

Hans-Dieter Ilge, Dieter Faßer, Horst Hartmann

Журнал:

Zeitschrift für Chemie

Рік:

1984

Мова:

german

Файл:

PDF, 260 KB

german, 1984

1H-NMR-Spektren von styrylsubstituierten Bor-1,3-diketonaten

Reiner Radeglia, Hans-Dieter Ilge, Horst Hartmann

Журнал:

Zeitschrift für Chemie

Рік:

1985

Мова:

german

Файл:

PDF, 237 KB

german, 1985

Zur Darstellung einer neuen Klasse tieffarbiger Bis-1,3-diketonato-boroniumsalze

Horst Hartmann, Torsten Schumann, Roland Dusi, Uwe Bartsch, Hans-Dieter Ilge

Журнал:

Zeitschrift für Chemie

Рік:

1986

Мова:

german

Файл:

PDF, 262 KB

german, 1986

Zu einigen Besonderheiten im Absorptionsverhalten von kationischen und neutralen 1,3-Diketoboraten

Hans-Dieter Ilge, Horst Hartmann

Журнал:

Zeitschrift für Chemie

Рік:

1986

Мова:

german

Файл:

PDF, 277 KB

german, 1986

High Yield Production and Purification of Recombinant Staphylokinase for Thrombolytic Therapy

Hartmann, Manfred, Gührs, Karl-Heinz, Birch-Hirschfeid, Eckhard, Pohl, Hans-Dieter, Vanderschueren, Steven, Werf, Frans Van de, Michoel, Armand, Collen, Désiré, Behnke, Detlev, Schlott, Bernhard

Журнал:

Bio/Technology

Рік:

1994

Файл:

PDF, 754 KB

1994

Adenovirus-Mediated Gene Transfer of Interleukin-4 to Corneal Endothelial Cells and Organ Cultured Corneas Leads to High IL-4 Expression

THOMAS RITTER, KATRIN VOGT, PETER RIECK, ANTJE SCHILLING-SCHÖN, JAY KOLLS, CHRISTIAN HARTMANN, HANS-DIETER VOLK, UWE PLEYER

Журнал:

Experimental Eye Research

Рік:

1999

Мова:

english

Файл:

PDF, 191 KB

english, 1999

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Mechanical stress and electromigration in an aluminum meander structure

Yu, Xiaoying, Weide, Kirsten, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 180 KB

english, 1997

[Part 2: Biological Sciences] || Anaerobic Growth of Halobacteria

Rainer Hartmann, Hans-Dieter Sickinger and Dieter Oesterhelt

Журнал:

Proceedings of the National Academy of Sciences

Рік:

1980

Мова:

english

Файл:

PDF, 654 KB

english, 1980

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Time reduction of MCM-D prototype realization by process control and modeling

Fremont, Helene, Ahrens, C., Saint Christophe, E., Enoeckl, B., Fathi, M., N'kaoua, G., Pellet, C., Ferretti, Ruediger, Danto, Yves, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 869 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Laser chemical vapor deposition of Cu and Ni in integrated circuit repair

Leppaevuori, Seppo, Remes, Janne, Moilanen, Hannu, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 882 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Improving yield and reliability of FIB modifications using electrical testing

Desplats, Romain, Benbrik, Jamel, Benteo, Bruno, Perdu, Philippe, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 3.13 MB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Plasma-etching-induced oxide degradation: effects upon device performance and circuit yield

Martin, Scott T., Li, Guann-pyng, Worley, Eugene, White, Joe, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 787 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Unique case study of low yield analysis of 1.5-μm BiCMOS technology

Teoh, C. S., Lin, James, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 1.25 MB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Industrial use of conductive adhesives for SMT assemblies

Perichaud, M. G., Fremont, Helene, Salagoity, M., Faure, C., Danto, Yves, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 1.50 MB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Plasma-induced oxide contamination in a 0.35-um CMOS process

Karnett, Martin P., Zhou, Jingrong, Ghosh, Sumanta, Echtle, Danny, Fritz, L., Manley, Martin, Scott, Gregory S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 549 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Simulation of charging voltages on a wafer during plasma etch

Oner, M., Bhuva, Bharat L., Sisterhen, P., Hasan, H., Kerns, Sherra E., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 134 KB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Evaluation of pad life in chemical mechanical polishing process using statistical metrology

Muthukrishnan, N. Moorthy, Prasad, Sharad, Stine, Brian, Loh, William, Nagahara, Ron, Chung, James E., Boning, Duane S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 458 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Foundry technology trend

Sun, Jack Y. C., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 1.97 MB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Equipment challenges for a total material system change: enabling device manufacturing at 130 nm and below

Harrus, Alain S., Kelly, John, Powell, Ronald A., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 240 KB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Defect analysis and classification in process control using an SEM and EDX review station

Perret, Pascal, Zinssner, Vincent, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 1.87 MB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - SPRT for Weibull distributed integrated circuit failures

Chandramouli, Rajarathnam, Vijaykrishnan, N., Ranganathan, N., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 396 KB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Using IDD to analyze analog faults and development of a sensor

Maidon, Yvan, Deval, Yann, Fremont, Helene, Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 516 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Modern concept of focused ion beam techniques for reliability analysis in VLSI manufacturing

Ulieru, Dumitru G., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 748 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Defect detection and control in an analog CMOS process

Taucher, Franz, Evans, Ivor R., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 553 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - STADIUM SOI reliability simulator for the analysis of hot-electron and ESD-induced degradation in nonisothermal devices

Lee, David, Sanders, Thomas J., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 443 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Statistical effects of plasma etch damage on hot-carrier degradation

Bhuva, Bharat L., Janapaty, Vijay, Bui, N., Kerns, Sherra E., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 254 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Characterization of intrinsic thin silicon dioxide breakdown under static and dynamic stress

Chaparala, Prasad, Suehle, John S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 714 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Determination of critical process steps for enhanced yield improvement

Duluc, J. B., Zimmer, Thomas, Lewis, N., Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 766 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Multilevel Interconnection: Issues That Impact Competitiveness - Yield and reliability of laser-formed vertical links

Hartmann, Hans-Dieter, Hillmann-Ruge, Thomas, Hoang, Hoang H., Schutz, Ron, Bernstein, Joseph B., Vasquez, Barbara

Рік:

1993

Мова:

english

Файл:

PDF, 1.44 MB

english, 1993

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Automatic final inspection: an important nonexpensive control to guarantee long-term reliability

Kiel, Friedbald, Balbo, Guiseppe, Duzi, Eyal, Andrianaivo-Golz, Olga, Kohnen, Thomas, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 722 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Die-counting algorithm for yield modeling and die-per-wafer optimization

Croft, Gregg D., Lomenick, Robert L., Youngblood, Douglas L., Johnston, Jeffrey M., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 753 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Characterization of snap-back breakdown and its temperature dependence up to 300°C including circuit-level model and simulation

Uffmann, Dirk, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 468 KB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Fault isolation with fanin tree technique

Ng, Kang S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 381 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Design of the UltraSPARC-I microprocessor for manufacturing performance

Youngs, Lynn, Billus, Greg, Jones, Anjali, Paramanandam, Siva, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 555 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Inter- and intra-die polysilicon critical dimension variation

Stine, Brian, Boning, Duane S., Chung, James E., Bell, David A., Equi, Edward, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 562 KB

english, 1996

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Fault diagnosis of CMOS LSI with various leakage current state using abnormal IDDQ phenomenon

Sanada, Masaru, Fujioka, Hiromu, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Рік:

1998

Мова:

english

Файл:

PDF, 1.31 MB

english, 1998

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Modeling of defect propagation/growth for yield impact prediction in VLSI manufacturing

Li, Xiaolei, Strojwas, Andrzej J., Swecker, Aaron L., Reddy, Mahesh, Milor, Linda, Lin, YungTao, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1997

Мова:

english

Файл:

PDF, 767 KB

english, 1997

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Reliability issue on pipeline defects in CMOS memory devices

Youn, So, Terrell, Kyle, Wu, Chau-Chin, Shy, Paul, Lien, Chuen-Der, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Рік:

1996

Мова:

english

Файл:

PDF, 1.09 MB

english, 1996